Differences Between Semiconductor Substrate And Epitaxy

May 06, 2025 Leave a message

 

1. Substrate

1. Definition and function

·Physical support: The substrate is the carrier of the semiconductor device, usually a circular or square single crystal wafer (such as a silicon wafer).

·Crystal template: Provides a template for atomic arrangement for epitaxial layer growth to ensure that the epitaxial layer is consistent with the substrate crystal structure (homoepitaxial) or matches (heteroepitaxial).

·Electrical basis: Part of the substrate directly participates in the conduction of the device (such as silicon-based power devices), or acts as an insulator to isolate the circuit (such as a sapphire substrate).

2. Comparison of mainstream substrate materials

Materials

Features

Typical applications

Silicon (Si)

Low cost, mature technology, medium thermal conductivity

Integrated circuits, MOSFET, IGBT

Sapphire (Al₂O₃)

Insulation, high temperature resistance, large lattice mismatch (up to 13% with GaN)

GaN-based LEDs, RF devices

Silicon Carbide (SiC)

High thermal conductivity, high breakdown field strength, high temperature resistance

Electric vehicle power modules, 5G base station RF devices

Gallium Arsenide (GaAs)

Excellent high frequency characteristics, direct band gap

RF chips, laser diodes, solar cells

Gallium nitride (GaN)

high electron mobility, high voltage resistance

fast charging adapter, millimeter wave communication devices

3. Core considerations for substrate selection

· Lattice matching: reduce epitaxial layer defects (e.g. GaN/sapphire lattice mismatch reaches 13%, requiring a buffer layer).

· Thermal expansion coefficient matching: avoid stress cracking caused by temperature changes.

· Cost and process compatibility: For example, silicon substrates dominate the mainstream due to mature processes.

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2. Epitaxial Layer

1. Definition and Purpose

Epitaxial growth: Deposition of single crystal thin film on the substrate surface by chemical or physical methods, with the atomic arrangement strictly aligned with the substrate.

Core Functions:

  • Improve material purity (the substrate may contain impurities).
  • Build heterogeneous structures (such as GaAs/AlGaAs quantum wells).
  • Isolate substrate defects (such as micropipe defects on SiC substrates).

2. Classification of Epitaxial Technology

Technology

Principle

Features

Applicable materials

MOCVD

Metal organic source + gas reaction (such as TMGa + NH₃ to generate GaN)

Suitable for compound semiconductors, mass production

GaN, GaAs, InP

MBE

Molecular beam layer-by-layer deposition under ultra-high vacuum

Atomic-level control, slow growth rate, high cost

Superlattice, quantum dots

LPCVD

Thermal decomposition of silicon source gas (such as SiH₄) under low pressure

Mainstream silicon epitaxy technology, good uniformity

Si, SiGe

HVPE

High temperature halide vapor phase epitaxy

Fast growth rate, suitable for thick films (such as GaN substrates)

GaN, ZnO

3. Key parameters of epitaxial layer design

  • Thickness: from a few nanometers (quantum well) to tens of microns (epilayer of power devices).
  • Doping: Precisely control the carrier concentration by doping impurities such as phosphorus (N-type) and boron (P-type).
  • Interface quality: Lattice mismatch needs to be alleviated by buffer layer (such as GaN/AlN) or strained superlattice.

4. Challenges and solutions of heteroepitaxial growth

  • Lattice mismatch:
  • Gradient buffer layer: Gradually change the composition from substrate to epitaxial layer (such as AlGaN gradient layer).
  • Low-temperature nucleation layer: Grow thin layers at low temperature to reduce stress (such as low-temperature AlN nucleation layer of GaN).
  • Thermal mismatch: Select a combination of materials with similar thermal expansion coefficients, or use a flexible interface design.

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3. Synergistic application cases of substrate and epitaxy

Case 1: GaN-based LED

Substrate: sapphire (low cost, insulation).

Epitaxial structure:

  • Buffer layer (AlN or low-temperature GaN) → Reduce lattice mismatch defects.
  • N-type GaN layer → Provide electrons.
  • InGaN/GaN multi-quantum well → Light-emitting layer.
  • P-type GaN layer → Provide holes.

Result: Defect density is as low as 10⁸ cm⁻², and luminous efficiency is significantly improved.

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Case 2: SiC power MOSFET

Substrate: 4H-SiC single crystal (withstand voltage up to 10 kV).

Epitaxial layer:

  • N-type SiC drift layer (thickness 10-100 μm) → withstand high voltage.
  • P-type SiC base region → control channel formation.

Advantages: 90% lower on-resistance than silicon devices, 5 times faster switching speed.

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Case 3: Silicon-based GaN RF devices

Substrate: High-resistance silicon (low cost, easy to integrate).

Epitaxial layer:

  • AlN nucleation layer → alleviates the lattice mismatch between Si and GaN (16%).
  • GaN buffer layer → captures defects and prevents them from extending to the active layer.
  • AlGaN/GaN heterojunction → forms a high electron mobility channel (HEMT).

Application: 5G base station power amplifier, with a frequency of more than 28 GHz.