What Is The Difference Between Silicon Wafer <100>, <110>, <111>?

Apr 28, 2025Leave a message

1. Crystal structure and atomic arrangement
1.1 Atomic arrangement

<100> Crystal direction

  • Surface atomic arrangement: atoms are arranged along the edge of the cube to form a square grid.
  • Atomic density: the lowest (about atoms/cm²), the atomic distance is large, and the surface energy is high.
  • Bonding direction: the surface atomic bonds are perpendicular to the crystal plane and have high chemical activity.

 

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<110> Crystal surface

  • Atomic arrangement: Arranged along the diagonal direction of the cube face to form a rectangular grid.
  • Atomic density: Medium (about atoms/cm²).
  • Bonding direction: The surface atomic bonds are tilted at 45°, with high mechanical strength.

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1.2 Surface energy and chemical stability
<111> > <110> > <100> (Ranking of chemical stability)

  • <111> The surface has the best corrosion resistance due to its high atomic density and strong bonding;
  • <100> The surface atoms are loose and easily etched by chemicals (such as KOH).

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2. Anisotropic behavior
2.1 Wet chemical etching (taking KOH as an example)

Crystal orientation Etching rate (80℃, 30% KOH) Etching morphology Anisotropy ratio (<100>:<111>)
<100> ~1.4 μm/min V-groove (sidewall 54.7°) 100:1
<110> ~0.8 μm/min Vertical deep groove (sidewall 90°) 50:01:00
<111> ~0.01 μm/min Flat surface (etch stop layer) -

 

  • Key Mechanism: The etching rate of KOH on silicon is directly related to the degree of exposure of atomic bonds along the crystal direction.
  • <100>: Atomic bonds are easily attacked by OH⁻, and the etching rate is fast;
  • <111>: Atomic bonds are tightly shielded and almost unreactive.

 

2.2 Dry etching (such as plasma etching)

  • The crystal orientation has little effect, but the <111> high-density surface may cause micro-masking effect and form local roughness.

 

3. Comparison of process characteristics
3.1 Oxide layer quality

 

Crystal orientation SiO₂ defect density (cm⁻²) Interface state density (cm⁻²·eV⁻¹) Gate leakage current (nA/cm²)
<100> <1×10¹⁰ ~1×10¹⁰ <1
<111> ~1×10¹¹ ~1×10¹¹ >10
<110> ~5×10¹⁰ ~5×10¹⁰ ~5

 

  • <100> Advantages: Low-defect oxide layer is a core requirement of CMOS devices.

 

3.2 Carrier mobility (300K)

Crystal orientation Electron mobility (cm²/(V·s)) Hole mobility (cm²/(V·s))
<100> 1500 450
<110> 1200 350
<111> 900 250
  • Reason: The <100> crystal plane matches the symmetry of the silicon lattice, reducing carrier scattering.

 

 

4. Mechanical and thermal properties
4.1 Mechanical strength <111> > <110> > <100>

  • The fracture toughness is: 0.8 MPa·m¹/², 0.7 MPa·m¹/², 0.6 MPa·m¹/²
  • Application example: MEMS pressure sensors mostly use <110> wafers because their fatigue resistance is better than <100>.

 

4.2 Thermal expansion coefficient
The anisotropy of silicon leads to differences in thermal expansion coefficients in different crystal directions:

  • <100>: 2.6×10⁻⁶ /K
  • <110>: 1.6×10⁻⁶ /K
  • <111>: 0.5×10⁻⁶ /K

Impact: <111> wafers are prone to stress in high-temperature processes, and thermal budgets need to be carefully designed.

 

 

5. Application scenarios
5.1 <100> crystal orientation

  • Integrated circuits (ICs): More than 95% of the world's logic chips (such as CPUs and DRAMs) use <100> wafers.
  • Advantages: low interface state density, high carrier mobility, and oxide layer uniformity.
  • Solar cells: Pyramid structure formed by anisotropic etching, with a reflectivity of <5%.
  • Example: TSMC's 3nm process is based on <100> silicon, with a gate length of 12nm.

 

5.2 <110> Crystal Orientation
MEMS devices:

  • Accelerometers: Use vertical deep grooves to make movable masses (aspect ratio >20:1).
  • Pressure sensors: The piezoresistance coefficient is the largest in the <110> direction (e.g., the π₁₁ coefficient of silicon is 6.6×10^-11  Pa⁻¹).
  • High-frequency devices: <110> silicon substrates can reduce lattice mismatch stress in GaAs epitaxial growth.

 

5.3 <111> Crystal Orientation
Optoelectronic devices:

  • GaN epitaxial: High lattice match with <111> silicon (17% mismatch, compared to <100> 23%).
  • Quantum dot arrays: High-density atomic planes provide ordered nucleation sites.
  • Nanostructure templates: Used for AFM probe tips or nanowire growth.

 

 

6. Cost and industrial chain

Crystal orientation Market share Price (relative to <100>) Standardized process maturity
<100>> 90% Benchmark (1×) Fully standardized
<110> ~5% 2–3× Partially customized
<111> <5% 4–5× Highly customized

 

Cost drivers:

  • <100> Wafers have the lowest cost due to economies of scale;
  • <111> Wafers require special cutting and polishing processes.

 

 

Summary: The key basis for selecting crystal orientation

Demand Recommended crystal orientation Reasons
High-performance CMOS <100> Low interface state density, high mobility, mature process chain
MEMS deep trench structure <110> Vertical etching capability, high mechanical strength
Optoelectronic devices/quantum materials <111> High chemical stability, lattice matching advantage
Low-cost mass production <100> Scale effect, standardized supply chain